IEC 60749-9 Ed. 1.0 b:2002 PDF Download

$14.00

Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking
standard by International Electrotechnical Commission, 04/12/2002

Document Format: PDF

Description

Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive.

Product Details

Edition:
1.0
Published:
04/12/2002
Number of Pages:
9
File Size:
1 file , 410 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus